Automotive EMC Test Seminar in Santa Clara

Abstract: EMC filters can significantly add cost, volume and weight. A simulation based design process can aid in the optimization of the filter. The talk presents circuit and full wave based modeling methods for components of the filter, such as capacitors, inductors, common mode chokes and the modeling of the interaction between components. Material properties of “ferrite” like structures are discussed as they are bases for full wave modeling. Further, it shows future methods for none real time noise cancellation techniques that are especially suitable for high current hybrid vehicles

Bio: Dr. David Pommerenke (IEEEE Fellow) received his PhD at the Technical University Berlin, Germany. He joined HP for 5 years as EMC research engineer. For 17 years he is now in the EMC laboratory at the Missouri University of S&T. There his research and teaching focuses on Electronics, EMC, ESD, design of test instruments, and measurement techniques. He has published > 150 Journal papers. He is associated editor for the IEEE Transactions on EMC.

Abstact: Sniffer probes are conventionally used for localizing the sources of radiated emissions from electronic boards and systems. However, EMC engineers know from experience that hot areas, identified by the sniffer probes, do not necessarily correlate with radiated emissions test results. Emission source microscopy (ESM) scanning technology is a powerful tool to identify the radiated emission sources. In this scanning technology, the measurement is performed in “radiative” near-field (Fresnel) region as opposed to conventional near-field scanning which is usually performed in “reactive” near-field region. The phase-resolved measurement technique used in ESM helps with back-calculating the field to board or system surface to localize the contributing sources. This talk also covers the near-field effects of electrostatic discharge (ESD) and how near-field scanning can be used to identify root causes of ESD failures per ANSI/ESD SP14.5-2015. The correlation between IEC 61000-4-2 and ANSI/ESD SP14.5-2015 will be discussed.

Bio: Hamed Kajbaf received the PhD in electrical engineering from Missouri University of Science and Technology. He has previously worked at SpaceX as EMC Design Engineer. He is currently a Principal EMC Engineer at Amber Precision Instruments, San Jose, CA. His research interests include RF instrumentation, EMC and microwave scanning systems, near-field electromagnetic and acoustic measurement, and array signal acquisition/processing.

Abstract: GTS’s Comprehensive Electromagnetic Test (CET) solution for Vehicle is an EMC+OTA all-in-one test system, we can help customer to upgrade an EMC chamber and make it support SISO/MIMO OTA measurement, it can also be a phased-array antenna and a mmWave OTA test system. GTS can provide the total solution for automotive OTA measurement, from hardware to software, from test algorithm to system design, from technical consultant to system integration. Customers will have a fast/accurate/affordable system for automotive EMC+OTA measurement.

Bio: Wei (Fred) Yu received the Ph.D. degree in electrical engineering from Xidian University, Xi’an, China, in 2000. From 2001 to 2003, he did the Postdoctoral research with the University of Waterloo, Canada. He is the co-founder of General Test Systems Inc. (GTS). He holds 90 patents and rewarded the 2018 Technical Achievement Award (IEEE EMC Society) for outstanding contributions to wireless EMC and OTA testing. His current research interests include signal processing and mobile device test systems.

Abstract: Worldwide, the automotive industry is shifting towards electrification and autonomous driving. In this presentation, we will introduce our broad range of EMC automotive components test solutions that include e-motor and high-voltage battery test chambers. Furthermore, we will focus on full vehicle test facilities and are going to present our vehicle-2-vehicle solution.

Bio: Daniel is Director of Strategy, Marketing and Business Development at Frankonia Group. With more than 15 years experience in the field of product and project business, today he is actively developing the EMC market in the United States. In 2009 he got a Master of Science degree in strategy from Danube University in Austria followed by the doctor’s degree in Business Administration in 2015. Daniel has been engaged to the project business of EMC test facilities for more than 5 years now.

Abstract: This session will cover EMC measurement basics and Keysight solutions for automotive EMC testing, with a focus on interference (EMI) testing. Pre-compliance testing with a Keysight spectrum analyzer will help determine if the vehicle under test is on track for compliance. Keysight spectrum analyzers contain built-in preset measurement setups and test limits for the automotive EMC standard to optimize the testing and evaluation period.

Bio: Jason Shen is an RF/uW applications engineer at Keysight Technologies. He received his Bachelor’s in Electrical Engineering at San Jose State University in 2014 and has been in his role since May of 2018. Prior to then, he worked at LitePoint Corporation as a field applications engineer for 3 years. His background ranges from non-signaling wireless to component-level tests.

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Abstract:  Join iNARTE-certified EMC engineer Yuji Ikenaga as he covers a number of important topics relevant for automotive EMC engineer.  First, Mr. Ikenaga reviews the latest international standards for automotive EMC and what that could mean for you.  Next, he outlines a robust set of EMC test methodologies to use when reliable measurement are absolutely critical.  Thirdly, he talks about the new jointed EMI measurement solution developed by TOYO corporation in partnership with Keysight.  Mr. Ikenaga will close his session by breaking down the benefits of Rototest dynamometers and why they are simple to deploy in anechoic chambers environments.

Bio: Mr. Ikenaga, an iNARTE-certified EMC engineer since 1998 is a manager of TOYO Corporation EMC Engineering Team and has over 30 years of experience in the EMC measurement field and EMC test system design for automobile manufacturers and components makers in Japan. When he was a technical manager of TOYO’s calibration laboratory accredited by A2LA, he developed a calibration method for EMC measurement equipment, which has become TOYO’s standard.