TOYO will be present at IEEE EMC Mini Symposium on 10/12 at Biltmore Hotel in Santa Clara. Dr. Todd Hubing and Dr. Jun Fan will be speaking about the latest EMC technology. TOYO will showcase TOYO EMC test software and EMC test system, EMIStream for EMI simulation software and EM-ISight for near-field EMI scanner. If you have time, please join us!!! http://www.scvemc.org/