Automotive EMC Test Seminar Santa Clara Presentations

Automotive EMC Test Seminar Downloads

Santa Clara, CA | November 1, 2018

TOYO Introduction

Presentation 1 – EMC Filter Design for Automotive Modules by Professor David Pommerenke

Prof. David Pommerenke

Abstract: EMC filters can significantly add cost, volume and weight. A simulation based design process can aid in the optimization of the filter. The talk presents circuit and full wave based modeling methods for components of the filter, such as capacitors, inductors, common mode chokes and the modeling of the interaction between components. Material properties of “ferrite” like structures are discussed as they are bases for full wave modeling. Further, it shows future methods for none real time noise cancellation techniques that are especially suitable for high current hybrid vehicles

Presentation 2 -Near-Field Scanning: Searching for Root Causes by Hamed Kajbaf

Hamed Kajbaf

Abstract: Sniffer probes are conventionally used for localizing the sources of radiated emissions from electronic boards and systems. However, EMC engineers know from experience that hot areas, identified by the sniffer probes, do not necessarily correlate with radiated emissions test results. Emission source microscopy (ESM) scanning technology is a powerful tool to identify the radiated emission sources. In this scanning technology, the measurement is performed in “radiative” near-field (Fresnel) region as opposed to conventional near-field scanning which is usually performed in “reactive” near-field region. The phase-resolved measurement technique used in ESM helps with back-calculating the field to board or system surface to localize the contributing sources. This talk also covers the near-field effects of electrostatic discharge (ESD) and how near-field scanning can be used to identify root causes of ESD failures per ANSI/ESD SP14.5-2015. The correlation between IEC 61000-4-2 and ANSI/ESD SP14.5-2015 will be discussed.

Presentation 3 -Weighing the Elephant: Testing 5G-enabled Cars by Dr. Fred Yu

Dr. Fred Yu

Abstract: GTS’s Comprehensive Electromagnetic Test (CET) solution for Vehicle is an EMC+OTA all-in-one test system, we can help customer to upgrade an EMC chamber and make it support SISO/MIMO OTA measurement, it can also be a phased-array antenna and a mmWave OTA test system. GTS can provide the total solution for automotive OTA measurement, from hardware to software, from test algorithm to system design, from technical consultant to system integration. Customers will have a fast/accurate/affordable system for automotive EMC+OTA measurement.

Presentation 4 -Automotive EMC Test Facilities from Frankonia by Dr. Daniel Feyerlein

Dr. Daniel Feyerlein

Abstract: Worldwide, the automotive industry is shifting towards electrification and autonomous driving. In this presentation, we will introduce our broad range of EMC automotive components test solutions that include e-motor and high-voltage battery test chambers. Furthermore, we will focus on full vehicle test facilities and are going to present our vehicle-2-vehicle solution.

Presentation 5 -Automotive EMC Testing with Keysight by Jason Shen

Jason Shen

Abstract: This session will cover EMC measurement basics and Keysight solutions for automotive EMC testing, with a focus on interference (EMI) testing. Pre-compliance testing with a Keysight spectrum analyzer will help determine if the vehicle under test is on track for compliance. Keysight spectrum analyzers contain built-in preset measurement setups and test limits for the automotive EMC standard to optimize the testing and evaluation period.

Presentation 6 – Introduction of Automobile EMC Standard and TOYO Test System by Yuji Ikenaga

Yuki Ikenaga

Abstract: In this session, we will give you an overview of the international automotive EMC standard and the test system required for obtaining highly reliable test results when you test against the standard.