Monthly Archives: May 2018

Display Week 2018 – It’s a Wrap

May 29, 2018

During the week of May 23, TOYO, TOYOTech and other exhibiting sponsors participated in the Display Week event held in Los Angeles, California.  I am still waiting to find out the official number of people who attended but all told, there were over 250 exhibitors spread out over the 210,000 square foot area of the Los Angeles Convention Center, West Hall.

There was so much excitement in the TOYO booth as we proudly announced the new LT1000 Ion Impurity Measurement System at the show and to the world.  In case you missed it, you can read the announcement on our website.  You can also watch a short 3-minute video highlighting the product including a technical deep dive on how it works.  Here’s a snippet from the release which summarizes what makes the LT1000 so special.

The LT1000 provides measurement performance, testing accuracy and material type support that far exceeds any other solution available in the marketplace.

For example, the LT1000 has high sensitivity – with resolution in the parts per trillion range.  The traditional approach can resolve at the parts per million range.  Yes, you read that correctly.  The LT1000 has a resolution that’s one million times better than the traditional approach.

On hand in our booth were the engineering leads of the LT1000, Masaru Inoue, and Noriaki Oyabu.  We were also joined by our marketing and sales colleagues from Japan, Osamu Tomita, and Yoko Nonaka and from TOYO China, Jerhyn Chen.  Good thing we had a full team on board because during the three days of the exhibit, there was almost a non-stop stream of folks that came by to visit and learn about the LT1000 and/or participate in our raffle where we gave away not one, not two, but five different prizes.  Congratulations to all of the winners.  For me personally, I had the privilege of meeting and speaking to at least 100 booth visitors.  Take a look at some of the pictures that we took of the event.

On, Thursday, during the last afternoon of the exhibit, the head of marketing for the Society for Information Display (SID) passed by and praised the design of our booth display.  Apparently, during one of his marketing sessions, he specifically cited our booth and graphics as a great example of how to effectively convey a message to the show’s participants.   Needless to say, we were ecstatic.   So much so that we started talking about how to make next year’s show even better.

Well, enough about our booth.  I also had the opportunity to walk the floor and check out the emerging electronic display technologies that were being showcased.  No surprise, there was a dizzying array of products and perhaps soon to be products.  My colleague Jerhyn took pictures of some amazing technologies and products which we are sharing with you.  Take a look.

Next year Display Week will be taking place in our backyard in San Jose.  We look forward to it and we look forward to seeing many of you again at the event.

Steve Wong

VP of Marketing & Product Management
steve.wong@toyotechus.com

 

 

 

 

Press Release: TOYO Corporation Unveils Innovative Ion Impurity Measurement System

May 22, 2018

TOYO Corporation Unveils Innovative Ion Impurity Measurement System

The patent?pending LT1000, supporting broad applications including organic light?emitting diode (OLED) and smart window component analysis for the display industry, will revolutionize measurement workflows

 

Display Week 2018, Los Angeles, CA, May 22, 2018 ? TOYO Corporation, the leading test and measurement company, today announced the new LT1000 Ion Impurity Measurement System, the first laboratory instrument able to characterize and quantify both organic and inorganic ion impurity in liquid?based substances. The product is the culmination of over twenty years of liquid crystal display (LCD) measurement research and development work carried out by TOYO’s engineering teams. The LT1000 provides measurement performance, testing accuracy and material type support that far exceeds any other solution available in the marketplace.

Existing impurity measurement methods are based on a chemical analysis approach. They are designed to measure only impurity and operate only on inorganic materials. The LT1000 probes organic and inorganic materials by measuring their ion impurity, the most accurate and reliable measurement method known. This ability paves the way for the testing of newer sample types that feature organic materials. Hence, the instrument can be used to not only test critical LCD components and subcomponents but also OLED ones relied upon by the display industry.

Unlike some other techniques which measure in the parts per million (ppm) range, the LT1000 measures in the parts per trillion (ppt) range, providing for a million times better resolution.

The LT1000 also outclasses other solutions in performance. It can conduct a complete measurement cycle in less than a second. In comparison, traditional approaches can take upwards of 30 minutes.  The LT1000 is more than 1,800 times faster. In a lab setting, this translates to accelerated research and development workflows. In a production and manufacturing environment, the LT1000 makes high?volume testing possible.

Key Advantages

  • High Sensitivity: Detect even the lowest concentration of ion impurity
  • Versatile: Supports quantitative organic and inorganic ion impurity measurement
  • Performance: Extremely fast measurement cycles; less than one second (typical)
  • Portable: Weighs less than 11 pounds (5 kgs)
  • Technological Advance: High?resistivity dielectric material deployed on electrodes

The TOYO Corporation LT1000 Ion Impurity Measurement System will begin sampling for select customers beginning in August 2018. It will be generally available in October 2018. For pricing and further information, please visit www.toyotechus.com or follow us on Linkedin and Twitter.

About TOYO Corporation

TOYO Corporation (TSE: 8151) is a Japanese technology company headquartered in Tokyo, Japan, with subsidiaries in the United States and China. Since its founding in 1953, TOYO has become the leading distributor of advanced measurement instruments and systems in Japan. TOYO also engages in original product designs and develops advanced solutions for many of the markets that it serves including automotive, sustainable energy, and cybersecurity industries. TOYO’s innovative products are used by many leading companies in Japan, the United States and APAC countries, helping TOYO’s customers accelerate development, reduce time?to?market, and improve product quality. For more information, please visit the company’s website at https://www.toyo.co.jp/english/.

Contact:

Steve Wong
steve.wong@toyotechus.com
View Press Release

Why Netflow is not enough

May 18, 2018

Most large organizations enable netflow in their network routers and switches as part of their application or network performance suite of tools.  It provides a high-level view of an interface’s overall throughput, very helpful for determining on congestion conditions and who’s using the link (bandwidth hog).

Netflow was originally introduced by Cisco for their routers where it collected IP network flow statistics at an interface.  That data can then be forwarded to a netflow collector for consolidation and analysis.  Since then, various network infrastructure vendors have come up with their own versions (i.e. Jflow from Juniper Networks) to help monitor their own equipment.  However, they all serve the same purpose which is to provide network engineers a high-level view of their network: throughput, applications, class of service, users (IP addresses).

While netflow help identify congestion and network bandwidth hogs, it does have limitations when it comes to troubleshooting network issues:

  • Data is summarized in 1 to 5 minute windows so granularity is lost
  • Most internet based apps are lumped under port 80 so any application running over HTTP can’t be identified or summarized
  • When network load is too high, sampling is used which translates to missed data.

So during network analysis, Netflow will point you to where to look but not the details.  A netflow deployment should be complemented with a full network recorder (packet capture) solution.  So, when detailed network analysis is required, packets are readily available   Packet visibility is important because:

  • Packets provide the most granular level of network data for fault analysis
  • Packets, when collected without loss, allows detailed analysis bit by bit, byte by byte) from header to payload.
  • Records of packets can be analyzed and re-analyzed.
  • Packets records can be used for validating fixes on network appliances (Security, APM/NPM,…etc).
  • NEMs,network engineers,application engineers will typically require packet records to analyze and fix network equipment or application issues.
  • Packet can be used for compliance (i.e. HIPPA).

Packet is King when full network analysis is required, something that non-packet based solutions like netflow can’t provide.

For more information

Angelo Bustos

Solutions Consultant Director

angelo.bustos@toyotechus.com

 

EMC Fest 2018 – Yoshi Fukawa’s Recap

May 11, 2018

This past Thursday, TOYO exhibited at the EMC Fest in Livonia Michigan.  This was the second time we exhibited at this event and we were delighted to see that the “fest” has grown once again this year.  There were over 180 attendees and 42 vendors participating this time around.  A sizeable increase from the previous year.  My colleagues Nick Sugawara and Barry Steltz also took part in this event with me.

During the presentation sessions, engineers flocked to the various vendor booths and tabletop at the event to learn about the very latest in EMC products and technologies.  TOYO presented our Automotive EMC Test Solutions which includes the TOYO EMC test software and system, EMI receivers from Keysight, power amplifiers from AMETEK, near-field EMI scanner from API, OTA test solutions from GTS, E-Drive testbench from Frankonia and EMI simulation software from NEC.

We got quite a few inquiries for the E-Drive test bench and near-field EMI scanner.  TOYO is now offering a wide variety of Automotive EMC Test Solutions, so we are pretty sure TOYO could help your automotive EMC test needs.

We would like to extend a thank you to the organizers for staging such an amazing event.  And we’ll definitely be back next year.

-Yoshi Fukawa

Great experience at EMC MiniSymposium!

May 9, 2018

This past Tuesday (May 8), my colleagues Nick Sugawara, Yoshi Fukawa and I participated in the IEEE EMC MiniSymposium event that took place just outside of Chicago.  In the past, I have attended events like this many times before, but this experience was unique.  Instead of being a participant, I now attended as an almighty and all-knowing vendor!  Yes, my first booth duty assignment!  I found the change in perspective interesting.  Instead of looking for new products and ideas, my role now was to drive excitement!

With brochures and other collateral in hand, we were able to pique the interest of like-minded folks.  Talking shop with some of the estimated 60 or so EMC professionals, made me appreciate our common career path even more.  After these brief discussions, I thought that at least I was able to share some of my experience and knowledge.  In turn, I learned a little more about them and their needs, critical for any sales team.

This show certainly gave me a new perspective on what the EMC groups are like in different areas as attending a show of this type in the Chicagoland area is a first for me.  I certainty look forward to next year’s event.

So, if you passed by our tabletop area during the MiniSymposium and we were able to chat a bit, I hope you walked away with more knowledge about Toyo’s solutions for the EMC space.

-Barry Steltz

Upcoming Trade Show: EMC Fest on 5/10

May 7, 2018

TOYO will exhibit at EMC Fest on 5/10 to showcase TOYO EMC test software and system, Keysight EMI receiver, GTS OTA measurement solution, API near-field EMI scanner, NEC EMI simulation software, EMIStream. If you have time, please join us!!! http://www.emcfest.org

 

Upcoming Trade Show: EMC Chicago on 5/8

May 7, 2018

TOYO will exhibit at EMC Chicago on 5/8 to showcase TOYO EMC test software and system, Keysight EMI receiver, GTS OTA measurement solution, API near-field EMI scanner, NEC EMI simulation software, EMIStream. If you have time, please join us!!! http://www.emcchicago.org/

100G and Network Packet Brokers – eliminating the packet visibility dilemma

May 3, 2018

Network Packet brokers like Gigamon and Ixia provide network visibility.  They classify, filter, and share the aggregated load into sizeable chunks for network and security tools to handle.   If you have a network packet broker solution, then congratulations!  It means you manage a sizeable network that’s worthy of such a solution.  However, it still gets complicated as your network traffic grows beyond your network tools’ limits.  For example, you may have a 10G network recorder (packet capture) appliance.  However, with the increased traffic growth, that appliance will start struggling and lost packets will be the norm rather than the exception.  The recommended solution from your vendor is to buy more of his network recorders and balance the load amongst them with your network packet broker.  Good for your vendor but not so much for your wallet.  In addition, splitting streams between multiple network recorders has inherent issues.  You lose the big picture since you’re forced to work with isolated traffic.  Timing will also be lost when you recombine the packet streams into one because of “time drift”.  The real solution is a network recorder that keeps up with growing Ethernet rates.  One big picture and no complications.  Make sure it can handle beyond 10Gbps rates and in some cases, up to 100Gbps.  Do you agree or disagree?  Let us know.  Contact Us.

 

For more information: https://toyotechus.com/network-and-virtualization-solutions/packet-recorder/

Angelo Bustos

Solutions Consultant Director

angelo.bustos@toyotechus.com