Category Archives: EMC Blog

EMC Blog

2019 IEEE + SIPI EMC Symposium Recap

First of all, I like to thank Toyotech, all the attendees and first-time comers at the 2019 IEEE+SIPI EMC Symposium that took place in New Orleans from July 22 – July 26 of 2019. As a first-timer myself, I am very pleased that I had the opportunity to attend a technical event of this magnitude.

Toyotech introduced their new RE software EPX along with the new Keysight Receiver PXE which includes a TDS (Time Domain Scan) with an industry-leading 350 MHz Bandwidth. A lot of positive feedback was received from EMC engineers, auditors and not only from our current customers which includes automotive, commercial and military testing but also from future potential customers. We are a full EMC System integrator and with our user-friendly and highly customizable software, anyone can operate our system and take reliable EMC data.

It is a great opportunity to meet young professionals, build a stronger network, and enjoy a night out with a new group of friends.

 

Enri Nuraj
EMC Engineer
enri.nuraj@toyotechus.com

TOYO EMC team has made great progress in 2018 in the United States

We were able to engage many engineers at EMC seminars around the country, the IEEE EMC Symposium Exhibition in Long Beach California, and the IEEE EMC Chapter Seminar Exhibitions in California, Chicago, Minneapolis, Michigan and Seattle. The accompanying technical discussions with the show’s attendees provided valuable feedback for our product development team for their roadmap planning sessions.

We successfully introduced the Automotive EMC System & Anechoic Chamber to Michigan based manufacturers and the EMC Test System into the OEM and EMC test houses in California. This is proof that TOYO has been acknowledged to have high technical capability and support satisfaction as an EMC system integrator.  The is especially evident by the fact that TOYO EMC test software continuously updates and enhances combined drivers to support the various measuring instruments.

Throughout the year, we often heard from various EMC test software users of how they were so impressed with our solution after their first look and free evaluation that they even switched from others to ours. This further motivated our engineers to continuously implement and improve our product functionality. The automatic measurement function of Emission Test Software is becoming a standard. In addition, the measurement sequence with less noise measurement error on the spectrum analyzer and the EMI receiver function that supports manual measurement are very effective for debugging work. Error detection by Immunity Test System picture recognition is effective for reducing the operator’s workload and improving the repeatability of the test. The solutions are very powerful so we always encourage engineers to evaluate our solutions for full appreciation.

We will continue providing outstanding EMC test solutions. Coming in the near future will be new releases of measurement software, integration of measurement environment for General Test, and EMC/OTA measurement systems for automobiles, Frankonia’s BlueBox test bench for testing EV motors which can be installed in existing anechoic chambers, etc

We would like to express our sincerest appreciation for the trust you have placed in us and best wishes for success and a prosperous new year to all our clients, partners and representatives in each region.  We’ll keep doing our best in supporting you.  Please feel free to contact us at info@toyotechus.com should you have any questions or concerns regarding EMC testing.


Nori “Nick” Sugawara
VP EMC Sales
nori.sugawara@toyotechus.com



EMC Show wrap up

Last week, TOYO exhibited at the IEEE EMC Symposium exhibition in Long Beach California.  This was the third time we exhibited at this event. My colleagues Yoshi Fukawa, Barry Steltz, Jim Baer, Naoki Hagihara and Irene Wong also took part.

In this year’s Symposium, the following two presentations caught my attention:

  1. Investigation on Difference of Radiated Emission Measurement Reproduction between Two EUTs at International RRT by using CMAD as a Terminating Device for AC Mains Cable, Shinichi Okuyama (VCCI Council / NEC Platforms, Ltd.)
  2. Ground Loops during Site Validation of Anechoic Rooms Below 30 MHz, Alexander Kriz (Seibersdorf Laboratories)

TOYO introduced our EMC test software and system, Keysight’s EMI Receiver, AMETEK’s power amplifier, API proximity electromagnetic scanner, GTS’s OTA test solution, Frankonia’s E-Drive test bench, Seibersdorf’s Loop Antenna and EMI simulation NEC software. I received many questions about the magnetic field measurement below 30 MHz spec under consideration by CISPR / A and the E – Drive test bench. As many of you know, TOYO currently offers a wide range of automotive EMC test solutions.

I appreciate the organizers who held such a wonderful event. And we will certainly be back next year.

-Nori “Nick” Sugawara

EMC Fest 2018 – Yoshi Fukawa’s Recap

This past Thursday, TOYO exhibited at the EMC Fest in Livonia Michigan.  This was the second time we exhibited at this event and we were delighted to see that the “fest” has grown once again this year.  There were over 180 attendees and 42 vendors participating this time around.  A sizeable increase from the previous year.  My colleagues Nick Sugawara and Barry Steltz also took part in this event with me.

During the presentation sessions, engineers flocked to the various vendor booths and tabletop at the event to learn about the very latest in EMC products and technologies.  TOYO presented our Automotive EMC Test Solutions which includes the TOYO EMC test software and system, EMI receivers from Keysight, power amplifiers from AMETEK, near-field EMI scanner from API, OTA test solutions from GTS, E-Drive testbench from Frankonia and EMI simulation software from NEC.

We got quite a few inquiries for the E-Drive test bench and near-field EMI scanner.  TOYO is now offering a wide variety of Automotive EMC Test Solutions, so we are pretty sure TOYO could help your automotive EMC test needs.

We would like to extend a thank you to the organizers for staging such an amazing event.  And we’ll definitely be back next year.

-Yoshi Fukawa

Great experience at EMC MiniSymposium!

This past Tuesday (May 8), my colleagues Nick Sugawara, Yoshi Fukawa and I participated in the IEEE EMC MiniSymposium event that took place just outside of Chicago.  In the past, I have attended events like this many times before, but this experience was unique.  Instead of being a participant, I now attended as an almighty and all-knowing vendor!  Yes, my first booth duty assignment!  I found the change in perspective interesting.  Instead of looking for new products and ideas, my role now was to drive excitement!

With brochures and other collateral in hand, we were able to pique the interest of like-minded folks.  Talking shop with some of the estimated 60 or so EMC professionals, made me appreciate our common career path even more.  After these brief discussions, I thought that at least I was able to share some of my experience and knowledge.  In turn, I learned a little more about them and their needs, critical for any sales team.

This show certainly gave me a new perspective on what the EMC groups are like in different areas as attending a show of this type in the Chicagoland area is a first for me.  I certainty look forward to next year’s event.

So, if you passed by our tabletop area during the MiniSymposium and we were able to chat a bit, I hope you walked away with more knowledge about Toyo’s solutions for the EMC space.

-Barry Steltz

TOYO was at the exciting EMC Milwaukee event!

If you dropped by our booth during the EMC Milwaukee event we would like to thank you!  If not, here are some of the things you missed out on:  TOYO’s EMC test software and systems, Keysight’s EMI receiver, GTS’ OTA measurement solution, API’s near-field EMI scanner, NEC’s EMI simulation software, and EMIStream.  We’ll see you next year!

If you have any questions or requests, feel free to contact us. (emc_sales@toyotechus.com)

Thank you for stopping by the TOYO booth at DesignCon 2018 in Santa Clara, California

If you dropped by our booth during DesignCon 2018 we would like to thank you!  If not, here are some of the things you missed out on: TOYO’s EMC test software and systems, Keysight’s EMI receiver, GTS’ OTA measurement solution, API’s near-field EMI scanner, NEC’s EMI simulation software, and EMIStreamand and Risho’s PCB materials that have high-speed, low-loss, high thermal conductive, low-CTE and low-modulus, high temperature resistant, and white-colored properties.  Thanks again and we’ll see you next year!

If you have any questions or requests, feel free to contact us. (emc_sales@toyotechus.com)